| Title | Dependence of carrier escape lifetimes on quantum barrier thickness in InGaN/GaN multiple quantum well photodetectors |
| Publication Type | Journal Article |
| Year of Publication | 2020 |
| Authors | Chow YChao, Lee C, Wong MS, Wu Y-R, Nakamura S, DenBaars SP, Bowers JE, Speck JS |
| Journal | Optics Express |
| Volume | 28 |
| Pagination | 23796–23805 |
| DOI | 10.1364/OE.399924 |
Grant:
CSC, MRL (new) (DMR-1720256), MRI (CNS-1725797)