First-principles characterization of defects in WO 3

TitleFirst-principles characterization of defects in WO 3
Publication TypeConference Paper
Year of Publication2018
AuthorsWang W, Peelaers H, Shen J-X, Janotti A, Van de Walle CG
Conference NameOxide-based Materials and Devices IX
PublisherInternational Society for Optics and Photonics
Grant: 
MRI R2 (CNS-0960316), CSC, MRL (new) (DMR-1720256)