| Title | Impact of native defects in high-k dielectric oxides on GaN/oxide metal–oxide–semiconductor devices |
| Publication Type | Journal Article |
| Year of Publication | 2013 |
| Authors | Choi M, Lyons JL, Janotti A, Van de Walle CG |
| Journal | physica status solidi (b) |
| Volume | 250 |
| Pagination | 787–791 |
Grant:
MRI R2 (CNS-0960316), CSC, MRL (DMR-1121053)