Publications
Filters: Author is Nakamura, Shuji [Clear All Filters]
Dependence of carrier escape lifetimes on quantum barrier thickness in InGaN/GaN multiple quantum well photodetectors. Optics Express. 28:23796–23805.
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2020. Research Toward a Heterogeneously Integrated InGaN Laser on Silicon. physica status solidi (a). 217:1900770.
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2020.