| Title | The role of oxygen-related defects and hydrogen impurities in HfO2 and ZrO2 |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Janotti A., Van de Walle C.G. |
| Journal | Microelectronic Engineering |
| Volume | 88(7) |
| Pagination | 1452-1456 |
Grant:
MRI, CSC