Publications

Filters: Author is Echlin, McLean P  [Clear All Filters]
Journal Article
Wang F, Echlin MLP, Taylor AA, Shin J, Bammes B, DA Levin B, De Graef M, Pollock TM, Gianola DS.  2020.  Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy. :113160.
Dawson PR, Miller MP, Pollock TM, Wendorf J, Mills LH, Stinville JCharles, Charpagne MAgathe, Echlin MLP.  2021.  Mechanical Metrics of Virtual Polycrystals (MechMet). Integrating Materials and Manufacturing Innovation. :1–21.

Acknowledgements

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Use was made of computational facilities purchased with funds from the National Science Foundation (CNS-1725797) and administered by the Center for Scientific Computing (CSC). The CSC is supported by the California NanoSystems Institute and the Materials Research Science and Engineering Center (MRSEC; NSF DMR 1720256) at UC Santa Barbara.

 

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